RELIABILITY, CRITERION-RELATED VALIDITY AND QUALITATIVE COMMENTS OF THE FOURTH EDITION OF THE STANFORD-BINET INTELLIGENCE SCALE WITH A YOUNG ADULT POPULATION WITH INTELLECTUAL DISABILITY

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DACEY, C.M., ET AL., RELIABILITY, CRITERION-RELATED VALIDITY AND QUALITATIVE COMMENTS OF THE FOURTH EDITION OF THE STANFORD-BINET INTELLIGENCE SCALE WITH A YOUNG ADULT POPULATION WITH INTELLECTUAL DISABILITY. JOURNAL OF INTELLECTUAL DISABILITY RESEARCH, Vol. 43, no. 3 (1999), p. 179-184.
Ref. 79983
Location: SIIS R.104
Palabras clave:
Diagnóstico, Discapacidad intelectual, Evaluación, Nivel intelectual, Tests, Validez

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